ISO 4287 pdf download.Geometrical Product Specifications (GPS) – Surface texture: Profile method – Terms, definitions and surface texture parameters
1 Scope
This International Standard specifies terms, definitions and parameters for the determination of surface tex- ture (roughness, waviness and primary profile) by profiling methods.
2 Normative references
The following standards contain provisions which, through reference in this text, constitute provisions of this International Standard. At the time of publication, the editions indicated were valid. All standards are subject to revision, and parties to agreements based on this International Standard are encouraged to in- vestigate the possibility of applying the most recent editions of the standards indicated below. Members of IEC and IS0 maintain registers of currently valid lnternational Standards. I S 0 3274: 1996, Geometrical Product Specifications (GPS) – Surface texture: Profile method – Nominal characteristics of contact (stylus) instruments. IS0 4288: 1996, Geometrical Product Specifications (GPS) – Surface texture: Profile method – Rules and procedures for the assessment of surface texture. IS0 11562: 1996, Geometrical Product Specifications (GPS) – Surface texture: Profile method – Metro- logical characterization of phase correct filters.
3 Terms and definitions
3.1 General terms 3.1.1 profile filter filter which separates profiles into longwave and shortwave components [ISO 115621 NOTE – There are three filters used in instruments for measuring roughness, waviness and primary profiles (see figure 1 ). They all have the same transmission character- istics, defined in IS0 1 1 562, but different cut-off wave- lengths.3.1.1.2 Ac profile filter filter which defines the intersection between the roughness and waviness components (see figure 1) 3.1.1.3 Af profile filter filter which defines the intersection between the waviness and the present in a surface even longer wave components see figure 1)3.1.2 coordinate system that coordinate system in which surface texture parameters are defined NOTE- It is usual to use a rectangular coordinate sys- tem in which the axes form a right-handed Cartesian set, the X-axis being the direction of tracing colinear with the mean line, the Y-axis also nominally lying on the real sur- face. and the Z-axis being in an outward direction (from the material to the surrounding medium). This convention is adopted throughout the rest of this International Standard. 3.1.3 real surface surface limiting the body and separating it from the surrounding medium 3.1.4 surface profile profile that results from the intersection of the real surface by a specified plane See figure 2. . NOTE- In practice, it is usual to choose a plane with a normal that nominally lies parallel to the real surface and in a suitable direction. 3.1.7 waviness profile profile derived by subsequent application of the profile filter 2f and the profile filter Ac to the primary profile, suppressing the longwave component using the prO- file filter 2f, and suppressing the shortwave com- ponent using the profile filter Ac; this profile is inten- tionally modified NOTES 1 The nominal form should first be removed from the total protile by best-fIt least- squares methods, before applying the 2f profile filter for separating the waviness profile. For circular nominal form, it is recommended that the radius should also be included in the least-squares optimization and not held fixed to the nominal value. This procedure for separating the waviness profile defines the ideal waviness operator. 2 The transmission band for waviness profiles is defined by the Ac and 2f profile filters (see ISO 11562:1996, 2.6 and 3.2). 3 The waviness profile is the basis for evaluation of the waviness profile parameters.
NOTE – The positive or negative portion of the assessed profile at the beginning or end of the sampling length should always be considered as a profile peak or as a profile valley. When determining a number of profile elements over several successive sampling lengths, the peaks and valleys of the assessed profile at the beginning or end of each sampling length are taken into account once only at the beginning of each sampling length.